Recently, I was involved in supporting an MBIST (memory built-in self-test) user. Because of an error in the design, the engineer couldn't run a memory test because ...

Majority of the silicon with-in a design is occupied by memories. Memories are more prone to failures than logic due to their density. Several techniques have been established to target and detect ...

“Spin Transfer Torque Magnetic Random Access Memory (STT-MRAM) is one of the most promising candidates to replace conventional embedded memory such as Static RAM and Dynamic RAM. However, due to the ...

Micron Technology (NASDAQ:MU) on Tuesday announced the shipment of HBM4 36GB 12-high samples to multiple key customers. Built on its 1ß (1-beta) DRAM process, 12-high advanced packaging technology, ...

Having explained in part 1 the nature of the memory test challenge in the industry today, this article discusses non-intrusive debug and test methods based on embedded instruments and how these ...