When designing microscopes, optical engineers have long faced a trade-off between speed, field of view and resolution. But ...

It is the computational processing of images that reveals the finest details of a sample placed under all kinds of different light microscopes. Even though this processing has come a long way, there ...

Atomic force microscopy, or AFM, is a widely used technique that can quantitatively map material surfaces in three dimensions, but its accuracy is limited by the size of the microscope's probe. A new ...

Researchers built a microscope that captures large, high-resolution images of uneven objects in one shot, aiding diagnostics, research, and quality inspection. (Nanowerk News) Researchers have ...

Researchers have developed a deep learning algorithm for removing systematic effects from atomic force microscopy images, enabling more precise profiles of material surfaces. Atomic force microscopy, ...

The microscope combines a big telecentric photolithography lens with a large tube lens to create sharp, detailed images of large and curved samples. These lenses project the image onto a flat array of ...